Feature referenced tip localization enhanced by probability motion model for AFM based nanomanipulations
Yuan S(袁帅); Liu LQ(刘连庆); Wang ZD(王志东); Xi N(席宁); Wang YC(王越超); Dong ZL(董再励); Wang ZY(王智宇); Wang ZB(王智博)
2011
会议名称2011 IEEE International Conference on Robotics and Biomimetics (ROBIO)
会议日期December 7-11, 2011
会议地点Phuket, Thailand
关键词Creep Probabilistic logic Sensors Trajectory Uncertainty Voltage control
页码1421-1426
中文摘要The spatial uncertainties of tip positioning due to the nonlinearity of the PZT scanner and thermal drift hinder the further application of the AFM based nanomanipulation. This paper brings forward feature referenced tip localization enhanced by probability motion model to reduce the spatial uncertainties. An improved motion model is probabilistically built by incorporating the PI model, the creep model and the thermal drift model. For calibrating the accurate model parameters, the statistical experiments are designed and performed. Then the tip position is optimally estimated by combining with a local scan based feature sensing method. The simulation and corresponding experiments are performed to illustrate the validity and feasibility of the calibrated parameters and the algorithm.
收录类别EI
产权排序1
会议主办者IEEE Robotics and Automation Society
会议录2011 IEEE International Conference on Robotics and Biomimetics (ROBIO)
会议录出版者IEEE Computer Society
会议录出版地Piscataway, NJ
语种英语
ISBN号978-1-4577-2136-6
内容类型会议论文
源URL[http://ir.sia.cn/handle/173321/8710]  
专题沈阳自动化研究所_机器人学研究室
推荐引用方式
GB/T 7714
Yuan S,Liu LQ,Wang ZD,et al. Feature referenced tip localization enhanced by probability motion model for AFM based nanomanipulations[C]. 见:2011 IEEE International Conference on Robotics and Biomimetics (ROBIO). Phuket, Thailand. December 7-11, 2011.
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