Study on diffusion behavior and microstructural evolution of Al/Cu bimetal interface by synchrotron X-ray radiography | |
Wang, Tongmin; Cao, Fei; Zhou, Peng; Kang, Huijun; Chen, Zongning; Fu, Yanan; Xiao, Tiqiao; Huang, Wanxia; Yuan, Qingxi | |
刊名 | JOURNAL OF ALLOYS AND COMPOUNDS
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2014 | |
卷号 | 616页码:550-555 |
关键词 | Interface diffusion Crystal growth Diffusion coefficient Al/Cu bimetal Synchrotron radiation |
ISSN号 | 0925-8388 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4428084 |
专题 | 大连理工大学 |
作者单位 | 1.Dalian Univ Technol, Sch Mat Sci & Engn, Key Lab Mat Modificat Laser Ion & Electron Beams, Minist Educ, Dalian 116024, Peoples R China. 2.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201204, Peoples R China. 3.Chinese Acad Sci, Inst High Energy Phys, Beijing 100039, Peoples R China. |
推荐引用方式 GB/T 7714 | Wang, Tongmin,Cao, Fei,Zhou, Peng,et al. Study on diffusion behavior and microstructural evolution of Al/Cu bimetal interface by synchrotron X-ray radiography[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2014,616:550-555. |
APA | Wang, Tongmin.,Cao, Fei.,Zhou, Peng.,Kang, Huijun.,Chen, Zongning.,...&Yuan, Qingxi.(2014).Study on diffusion behavior and microstructural evolution of Al/Cu bimetal interface by synchrotron X-ray radiography.JOURNAL OF ALLOYS AND COMPOUNDS,616,550-555. |
MLA | Wang, Tongmin,et al."Study on diffusion behavior and microstructural evolution of Al/Cu bimetal interface by synchrotron X-ray radiography".JOURNAL OF ALLOYS AND COMPOUNDS 616(2014):550-555. |
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