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A Multi-Scale Study on Silicon-Oxide Etching Processes in C4F8/Ar Plasmas
Sui Jiaxing; Zhang Saiqian; Liu Zeng; Yan Jun; Dai Zhongling
刊名PLASMA SCIENCE & TECHNOLOGY
2016
卷号18页码:666-673
关键词plasma etching multi-scale model trench profile surface process
ISSN号1009-0630
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4368380
专题大连理工大学
作者单位1.Dalian Univ Technol, Sch Phys & Optoelect Technol, Dalian 116024, Peoples R China.
2.Dalian Univ Technol, Dept Engn Mech, Dalian 116024, Peoples R China.
推荐引用方式
GB/T 7714
Sui Jiaxing,Zhang Saiqian,Liu Zeng,et al. A Multi-Scale Study on Silicon-Oxide Etching Processes in C4F8/Ar Plasmas[J]. PLASMA SCIENCE & TECHNOLOGY,2016,18:666-673.
APA Sui Jiaxing,Zhang Saiqian,Liu Zeng,Yan Jun,&Dai Zhongling.(2016).A Multi-Scale Study on Silicon-Oxide Etching Processes in C4F8/Ar Plasmas.PLASMA SCIENCE & TECHNOLOGY,18,666-673.
MLA Sui Jiaxing,et al."A Multi-Scale Study on Silicon-Oxide Etching Processes in C4F8/Ar Plasmas".PLASMA SCIENCE & TECHNOLOGY 18(2016):666-673.
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