Excellent optical quality versus strong grain boundary effect in a double-layer ZnO structure | |
Wu, Bin; Zhuang, Shi-Wei; Chi, Chen; Shi, Zhi-Feng; Jiang, Jun-Yan; Chu, Xian-Wei; Dong, Xin; Li, Wan-Cheng; Li, Guo-Xing; Zhang, Yuan-Tao | |
刊名 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY |
2016 | |
卷号 | 31 |
关键词 | ZnO grain boundary nanorods thin film MOCVD photoluminescence hall effect |
ISSN号 | 0268-1242 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4367136 |
专题 | 大连理工大学 |
作者单位 | 1.Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Qianjin St 2699, Changchun 130012, Peoples R China. 2.Zhengzhou Univ, Dept Phys, Zhengzhou 450052, Peoples R China.,Zhengzhou Univ, Phys Mat Lab, Zhengzhou 450052, Peoples R China. 3.Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Qianjin St 2699, Changchun 130012, Peoples R China. 4.Dalian Univ Technol, Sch Phys & Optoelect Technol, Dalian 116023, Peoples R China. |
推荐引用方式 GB/T 7714 | Wu, Bin,Zhuang, Shi-Wei,Chi, Chen,et al. Excellent optical quality versus strong grain boundary effect in a double-layer ZnO structure[J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY,2016,31. |
APA | Wu, Bin.,Zhuang, Shi-Wei.,Chi, Chen.,Shi, Zhi-Feng.,Jiang, Jun-Yan.,...&Du, Guo-Tong.(2016).Excellent optical quality versus strong grain boundary effect in a double-layer ZnO structure.SEMICONDUCTOR SCIENCE AND TECHNOLOGY,31. |
MLA | Wu, Bin,et al."Excellent optical quality versus strong grain boundary effect in a double-layer ZnO structure".SEMICONDUCTOR SCIENCE AND TECHNOLOGY 31(2016). |
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