| An Empirical Study of Learning to Rank Techniques for Effort-Aware Defect Prediction | |
| Yu, Xiao; Bennin, Kwabena Ebo; Liu, Jin; Keung, Jacky Wai; Yin, Xiaofei; Xu, Zhou | |
| 2019 | |
| 关键词 | effort-aware defect prediction learning to rank empirical study Scott-Knott ESD test |
| URL标识 | 查看原文 |
| 语种 | 英语 |
| 出处 | 2019 IEEE 26TH INTERNATIONAL CONFERENCE ON SOFTWARE ANALYSIS, EVOLUTION AND REENGINEERING (SANER) |
| 收录类别 | CPCI-S |
| 内容类型 | 其他 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4232710 |
| 专题 | 武汉大学 |
| 推荐引用方式 GB/T 7714 | Yu, Xiao,Bennin, Kwabena Ebo,Liu, Jin,et al. An Empirical Study of Learning to Rank Techniques for Effort-Aware Defect Prediction. 2019-01-01. |
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