On-Demand Generation of Single Silicon Vacancy Defects in Silicon Carbide | |
Wang, Jun-Feng; Li, Qiang; Yan, Fei-Fei; Liu, He; Guo, Guo-Ping; Zhang, Wei-Ping; Zhou, Xiong; Guo, Li-Ping; Lin, Zhi-Hai; Cui, Jin-Ming | |
刊名 | ACS Photonics
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2019 | |
卷号 | 6期号:7 |
DOI | 10.1021/acsphotonics.9b00451 |
URL标识 | 查看原文 |
收录类别 | EI |
语种 | 英语 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4231672 |
专题 | 武汉大学 |
推荐引用方式 GB/T 7714 | Wang, Jun-Feng,Li, Qiang,Yan, Fei-Fei,et al. On-Demand Generation of Single Silicon Vacancy Defects in Silicon Carbide[J]. ACS Photonics,2019,6(7). |
APA | Wang, Jun-Feng.,Li, Qiang.,Yan, Fei-Fei.,Liu, He.,Guo, Guo-Ping.,...&Guo, Guang-Can.(2019).On-Demand Generation of Single Silicon Vacancy Defects in Silicon Carbide.ACS Photonics,6(7). |
MLA | Wang, Jun-Feng,et al."On-Demand Generation of Single Silicon Vacancy Defects in Silicon Carbide".ACS Photonics 6.7(2019). |
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