Mapping the damaged zone around the crack tip in high density polyethylene with synchrotron microfocus small angle X-ray scattering technique

	Mapping the damaged zone around the crack tip in high density polyethylene with synchrotron microfocus small angle X-ray scattering technique
	Tang YJ ; Jiang ZY ; Enderle HF ; Lilge D ; Roth SV ; Gehrke R ; Rieger J ; An LJ ; Men YF
刊名	chinese journal of polymer science
	2010
卷号	28 期号:2 页码:165-170
关键词	INTERFACE DISTRIBUTION FUNCTIONS LAMELLAR 2-PHASE SYSTEMS SEMICRYSTALLINE POLYMERS TENSILE DEFORMATION STRUCTURAL-CHANGES GROWTH MECHANISMS CREEP
ISSN号	0256-7679
通讯作者	men yf
中文摘要	the structural changes around a crack tip in a high density polyethylene were investigated by means of scanning synchrotron microfocus small-angle x-ray scattering technique. the scattering data confirm the process of craze structure development near a crack tip based on the evolution of voids. in addition, it was found that the main stress in the plastic zone near a crack tip exhibited a gradient distribution with respect to its strength and direction. the whole damaged area showed a strain distribution indicating a flow behavior toward the crack tip.
收录类别	SCI收录期刊论文
语种	英语
WOS记录号	WOS:000274500600004
公开日期	2012-06-07
内容类型	期刊论文
源URL	[http://ir.ciac.jl.cn/handle/322003/43922]
专题	长春应用化学研究所_长春应用化学研究所知识产出_期刊论文
推荐引用方式 GB/T 7714	Tang YJ,Jiang ZY,Enderle HF,et al. Mapping the damaged zone around the crack tip in high density polyethylene with synchrotron microfocus small angle X-ray scattering technique[J]. chinese journal of polymer science,2010,28(2):165-170.
APA	Tang YJ.,Jiang ZY.,Enderle HF.,Lilge D.,Roth SV.,...&Men YF.(2010).Mapping the damaged zone around the crack tip in high density polyethylene with synchrotron microfocus small angle X-ray scattering technique.chinese journal of polymer science,28(2),165-170.
MLA	Tang YJ,et al."Mapping the damaged zone around the crack tip in high density polyethylene with synchrotron microfocus small angle X-ray scattering technique".chinese journal of polymer science 28.2(2010):165-170.