Feature extraction of analogue circuit fault signals via cross-wavelet transform and variational Bayesian matrix factorisation | |
He, Wei; He, Yigang; Li, Bing; Zhang, Chaolong | |
刊名 | IET SCIENCE MEASUREMENT & TECHNOLOGY
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2019 | |
卷号 | 13期号:2 |
ISSN号 | 1751-8822 |
DOI | 10.1049/iet-smt.2018.5432 |
URL标识 | 查看原文 |
收录类别 | SCIE |
语种 | 英语 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4217051 |
专题 | 武汉大学 |
推荐引用方式 GB/T 7714 | He, Wei,He, Yigang,Li, Bing,et al. Feature extraction of analogue circuit fault signals via cross-wavelet transform and variational Bayesian matrix factorisation[J]. IET SCIENCE MEASUREMENT & TECHNOLOGY,2019,13(2). |
APA | He, Wei,He, Yigang,Li, Bing,&Zhang, Chaolong.(2019).Feature extraction of analogue circuit fault signals via cross-wavelet transform and variational Bayesian matrix factorisation.IET SCIENCE MEASUREMENT & TECHNOLOGY,13(2). |
MLA | He, Wei,et al."Feature extraction of analogue circuit fault signals via cross-wavelet transform and variational Bayesian matrix factorisation".IET SCIENCE MEASUREMENT & TECHNOLOGY 13.2(2019). |
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