QQ客服 官方微博 反馈留言

	Feature extraction of analogue circuit fault signals via cross-wavelet transform and variational Bayesian matrix factorisation
	He, Wei; He, Yigang; Li, Bing; Zhang, Chaolong
刊名	IET SCIENCE MEASUREMENT & TECHNOLOGY
	2019
卷号	13期号:2
ISSN号	1751-8822
DOI	10.1049/iet-smt.2018.5432
URL标识	查看原文
收录类别	SCIE
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4217051
专题	武汉大学
推荐引用方式 GB/T 7714	He, Wei,He, Yigang,Li, Bing,et al. Feature extraction of analogue circuit fault signals via cross-wavelet transform and variational Bayesian matrix factorisation[J]. IET SCIENCE MEASUREMENT & TECHNOLOGY,2019,13(2).
APA	He, Wei,He, Yigang,Li, Bing,&Zhang, Chaolong.(2019).Feature extraction of analogue circuit fault signals via cross-wavelet transform and variational Bayesian matrix factorisation.IET SCIENCE MEASUREMENT & TECHNOLOGY,13(2).
MLA	He, Wei,et al."Feature extraction of analogue circuit fault signals via cross-wavelet transform and variational Bayesian matrix factorisation".IET SCIENCE MEASUREMENT & TECHNOLOGY 13.2(2019).

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。