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	Defect analysis of the LED structure deposited on the sapphire substrate
	Nie, Qichu; Jiang, Zhimin; Gan, Zhiyin; Liu, Sheng; Yan, Han; Fang, Haisheng
刊名	JOURNAL OF CRYSTAL GROWTH
	2018
卷号	488
关键词	Sapphire substrate The LED layer Dislocation Defects MQWs
ISSN号	0022-0248
DOI	10.1016/j.jcrysgro.2018.02.011
URL标识	查看原文
收录类别	SCIE ; EI
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4211429
专题	武汉大学
推荐引用方式 GB/T 7714	Nie, Qichu,Jiang, Zhimin,Gan, Zhiyin,et al. Defect analysis of the LED structure deposited on the sapphire substrate[J]. JOURNAL OF CRYSTAL GROWTH,2018,488.
APA	Nie, Qichu,Jiang, Zhimin,Gan, Zhiyin,Liu, Sheng,Yan, Han,&Fang, Haisheng.(2018).Defect analysis of the LED structure deposited on the sapphire substrate.JOURNAL OF CRYSTAL GROWTH,488.
MLA	Nie, Qichu,et al."Defect analysis of the LED structure deposited on the sapphire substrate".JOURNAL OF CRYSTAL GROWTH 488(2018).

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