Defect analysis of the LED structure deposited on the sapphire substrate | |
Nie, Qichu; Jiang, Zhimin; Gan, Zhiyin; Liu, Sheng; Yan, Han; Fang, Haisheng | |
刊名 | JOURNAL OF CRYSTAL GROWTH
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2018 | |
卷号 | 488 |
关键词 | Sapphire substrate The LED layer Dislocation Defects MQWs |
ISSN号 | 0022-0248 |
DOI | 10.1016/j.jcrysgro.2018.02.011 |
URL标识 | 查看原文 |
收录类别 | SCIE ; EI |
语种 | 英语 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4211429 |
专题 | 武汉大学 |
推荐引用方式 GB/T 7714 | Nie, Qichu,Jiang, Zhimin,Gan, Zhiyin,et al. Defect analysis of the LED structure deposited on the sapphire substrate[J]. JOURNAL OF CRYSTAL GROWTH,2018,488. |
APA | Nie, Qichu,Jiang, Zhimin,Gan, Zhiyin,Liu, Sheng,Yan, Han,&Fang, Haisheng.(2018).Defect analysis of the LED structure deposited on the sapphire substrate.JOURNAL OF CRYSTAL GROWTH,488. |
MLA | Nie, Qichu,et al."Defect analysis of the LED structure deposited on the sapphire substrate".JOURNAL OF CRYSTAL GROWTH 488(2018). |
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