Combination algorithm for curve fitting of X-ray photoelectron spectroscopy (XPS) data

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	Combination algorithm for curve fitting of X-ray photoelectron spectroscopy (XPS) data
	Y. D. Gong
刊名	Journal of Trace and Microprobe Techniques
	1997
卷号	15 期号:4 页码:399-404
关键词	XPS curve fitting combination algorithm
ISSN号	0733-4680
中文摘要	In this paper, a convoluted line shape is employed in the fitting procedure of X-ray photoelectron spectroscopy (XPS) data. Choosing an appropriate line shape is very important for curve fitting of XPS data. Generally, people choose the Gauss-Lorentz product function (GLP) or Gauss-Lorentz sum function (GLS) as the line Shape [3,4], but they are not strict because the true line shape is a convolution of Gaussian and Lorentzian. It is found that the convolution line shape can give more exact results for the processing of XPS data. The new algorithm is called "combination algorithm".
原文出处	://WOS:000071005400006
公开日期	2012-04-14
内容类型	期刊论文
源URL	[http://ir.imr.ac.cn/handle/321006/37961]
专题	金属研究所_中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. D. Gong. Combination algorithm for curve fitting of X-ray photoelectron spectroscopy (XPS) data[J]. Journal of Trace and Microprobe Techniques,1997,15(4):399-404.
APA	Y. D. Gong.(1997).Combination algorithm for curve fitting of X-ray photoelectron spectroscopy (XPS) data.Journal of Trace and Microprobe Techniques,15(4),399-404.
MLA	Y. D. Gong."Combination algorithm for curve fitting of X-ray photoelectron spectroscopy (XPS) data".Journal of Trace and Microprobe Techniques 15.4(1997):399-404.