Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE | |
He, Wei; He, Yigang; Li, Bing; Zhang, Chaolong | |
刊名 | ENTROPY
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2018 | |
卷号 | 20期号:8 |
关键词 | analog circuit fault diagnosis cross wavelet transform Tsallis entropy parametric t-distributed stochastic neighbor embedding support vector machine |
ISSN号 | 1099-4300 |
DOI | 10.3390/e20080604 |
URL标识 | 查看原文 |
收录类别 | SCIE |
语种 | 英语 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4156425 |
专题 | 武汉大学 |
推荐引用方式 GB/T 7714 | He, Wei,He, Yigang,Li, Bing,et al. Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE[J]. ENTROPY,2018,20(8). |
APA | He, Wei,He, Yigang,Li, Bing,&Zhang, Chaolong.(2018).Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE.ENTROPY,20(8). |
MLA | He, Wei,et al."Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE".ENTROPY 20.8(2018). |
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