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Morphology Evaluation of Microelectronic Packaging Substrates Using Shadow Moire Technique
Zhu, Fulong; Lin, Xinxin; Zhang, Wei; Fan, Jiajie; Liu, Sheng
刊名IEEE ACCESS
2018
卷号6
关键词Morphology microelectronic packaging substrate phase-shifting shadow moire
ISSN号2169-3536
DOI10.1109/ACCESS.2018.2842199
URL标识查看原文
收录类别SCIE
语种英语
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4156298
专题武汉大学
推荐引用方式
GB/T 7714
Zhu, Fulong,Lin, Xinxin,Zhang, Wei,et al. Morphology Evaluation of Microelectronic Packaging Substrates Using Shadow Moire Technique[J]. IEEE ACCESS,2018,6.
APA Zhu, Fulong,Lin, Xinxin,Zhang, Wei,Fan, Jiajie,&Liu, Sheng.(2018).Morphology Evaluation of Microelectronic Packaging Substrates Using Shadow Moire Technique.IEEE ACCESS,6.
MLA Zhu, Fulong,et al."Morphology Evaluation of Microelectronic Packaging Substrates Using Shadow Moire Technique".IEEE ACCESS 6(2018).
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