Stripe characterization in La1.6-xNd0.4SrxCuO4 thin films

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	Stripe characterization in La1.6-xNd0.4SrxCuO4 thin films
	Y. Liu ; J. F. Qu ; M. Zhu ; S. D. Zhang ; S. J. Feng ; X. G. Li
刊名	Physical Review B
	2004
卷号	70 期号:22
关键词	magnetic fluctuations normal-state superconductivity la2-xsrxcuo4 la2-x-yndysrxcuo4 transport insulator absence liquid phases
ISSN号	1098-0121
中文摘要	We report on the longitudinal (in-plane resistivity rho(ab)) and the transverse (Hall coefficient R-H) transport measurements of La1.6-xNd0.4SrxCuO4 epitaxial films (x=0.08,0.1,0.12,0.14,0.16) grown by an off-axis magnetron sputtering method. It is found that the resistivity jump corresponding to the structural phase transition from low-temperature orthorhombic (LTO) to low-temperature tetragonal (LTT) phase observed in the bulk crystals disappears in the films. All of the films on LaSrAlO4 (LSAO) substrate show the log(1/T) insulating behavior above T-c. The R-H peak broadening together with the LTT phase suppression suggests that the static charge stripes disappear in the films. From these experimental results, one can regard that the nonuniform localization of charge carriers in La1.6-xNd0.4SrxCuO4 films on LSAO, possibly in the form of dynamic stripes, should be responsible for the deviation of the Hall angle cot theta(H) from T-2 law below the metal-insulator crossover temperature T-MI.
原文出处	://WOS:000226111800093
公开日期	2012-04-14
内容类型	期刊论文
源URL	[http://ir.imr.ac.cn/handle/321006/35472]
专题	金属研究所_中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. Liu,J. F. Qu,M. Zhu,et al. Stripe characterization in La1.6-xNd0.4SrxCuO4 thin films[J]. Physical Review B,2004,70(22).
APA	Y. Liu,J. F. Qu,M. Zhu,S. D. Zhang,S. J. Feng,&X. G. Li.(2004).Stripe characterization in La1.6-xNd0.4SrxCuO4 thin films.Physical Review B,70(22).
MLA	Y. Liu,et al."Stripe characterization in La1.6-xNd0.4SrxCuO4 thin films".Physical Review B 70.22(2004).