Microstructural evolution of PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3) (n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness

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	Microstructural evolution of PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3) (n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness
	Y. L. Zhu ; S. J. Zheng ; X. L. Ma ; L. Feigl ; M. Alexe ; D. Hesse ; I. Vrejoiu
刊名	Philosophical Magazine
	2010
卷号	90 期号:10 页码:1359-1372
关键词	ferroelectrics transmission electron microscopy microstructure ferroelectric thin-films misfit relaxation mechanisms domain configurations heterostructures polarization
ISSN号	1478-6435
中文摘要	The microstructure of ferroelectric [PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3)](n) epitaxial multilayers (x/y 0.2/0.4, 0.4/0.6) deposited on SrRuO(3)-coated SrTiO(3) substrates by pulsed-laser deposition with different layer periodicity and layer thickness was characterized by means of transmission electron microscopy. Electron diffraction and contrast analysis revealed a very clear and well-separated layer sequence. The microstructures of PbZr(0.2)Ti(0.8)O(3)/PbZr(0.4)Ti(0.6)O(3) and PbZr(0.4)Ti(0.6)O(3)/PbZr(0.6)Ti(0.4)O(3) multilayers show a similar tendency in the dependence on the individual layer thickness. Whereas with thick individual layers, tetragonal a-domains are confined to specific layers of the two types of multilayers, below a certain critical thickness of the individual layers, a-domains extend over the whole film. This indicates a transition into a uniform tetragonal lattice and strain state of the whole multilayer. Increasing the layer periodicity further, the interfaces in PbZr(0.4)Ti(0.6)O(3)/PbZr(0.6)Ti(0.4)O(3) multilayers become rough, and complex a-domain configurations appear.
原文出处	://WOS:000276638400008
公开日期	2012-04-13
内容类型	期刊论文
源URL	[http://210.72.142.130/handle/321006/31802]
专题	金属研究所_中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. L. Zhu,S. J. Zheng,X. L. Ma,et al. Microstructural evolution of PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3) (n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness[J]. Philosophical Magazine,2010,90(10):1359-1372.
APA	Y. L. Zhu.,S. J. Zheng.,X. L. Ma.,L. Feigl.,M. Alexe.,...&I. Vrejoiu.(2010).Microstructural evolution of PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3) (n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness.Philosophical Magazine,90(10),1359-1372.
MLA	Y. L. Zhu,et al."Microstructural evolution of PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3) (n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness".Philosophical Magazine 90.10(2010):1359-1372.