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Dislocations in charge-ordered Pr(0.5)Ca(0.5)MnO(3) epitaxial thin films prepared by a two-step growth technique
Y. L. Zhu ; X. Wang ; M. J. Zhuo ; Y. Q. Zhang ; X. L. Ma
刊名Philosophical Magazine Letters
2010
卷号90期号:5页码:323-336
关键词dislocations transmission electron microscopy thin films perovskites misfit relaxation mechanisms moire fringe contrast magnetic-field domain configurations strain srtio3 interface substrate identification accommodation
ISSN号0950-0839
中文摘要Charge-ordered Pr(0.5)Ca(0.5)MnO(3) (PCMO) thin films epitaxially grown on SrTiO(3) (100) substrates were prepared by a two-step growth technique which resulted in a 10 nm thick first layer and a 70 nm thick main layer. The dislocations in the as-received films were investigated using conventional and high-resolution transmission electron microscopy. Pure-edge misfit dislocations with Burgers vectors a < 011 > and line directions < 100 > were found to be the major interfacial defects responsible for the full misfit relief in the PCMO films. These dislocations constitute a square grid of dislocation lines parallel to the PCMO/SrTiO(3) interface. In contrast, two types of dislocations were identified within the first layer. One is of edge type with Burgers vectors a < 110 > and line directions < 001 >; the other, of screw type with Burgers vectors a < 110 > and line directions < 110 >. Cross-slip of the latter may contribute to the multiplication of misfit dislocations necessary for a total misfit relaxation. Few threading dislocations were observed in the main layer. The dislocation configurations in the films are discussed in detail.
原文出处://WOS:000276719200003
公开日期2012-04-13
内容类型期刊论文
源URL[http://210.72.142.130/handle/321006/31800]  
专题金属研究所_中国科学院金属研究所
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Y. L. Zhu,X. Wang,M. J. Zhuo,et al. Dislocations in charge-ordered Pr(0.5)Ca(0.5)MnO(3) epitaxial thin films prepared by a two-step growth technique[J]. Philosophical Magazine Letters,2010,90(5):323-336.
APA Y. L. Zhu,X. Wang,M. J. Zhuo,Y. Q. Zhang,&X. L. Ma.(2010).Dislocations in charge-ordered Pr(0.5)Ca(0.5)MnO(3) epitaxial thin films prepared by a two-step growth technique.Philosophical Magazine Letters,90(5),323-336.
MLA Y. L. Zhu,et al."Dislocations in charge-ordered Pr(0.5)Ca(0.5)MnO(3) epitaxial thin films prepared by a two-step growth technique".Philosophical Magazine Letters 90.5(2010):323-336.
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