Interfacial characteristics and dielectric properties of Ba0.65Sr0.35TiO3 thin films | |
Quan, Zuci; Zhang, Baishun; Zhang, Tianjin; Zhao, Xingzhong; Pan, Ruikun; Ma, Zhijun; Jiang, Juan | |
刊名 | THIN SOLID FILMS
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2008 | |
卷号 | 516期号:6 |
关键词 | BST thin film XPS depth profiling BST/Pt interface dielectric properties |
ISSN号 | 0040-6090 |
DOI | 10.1016/j.tsf.2007.06.148 |
URL标识 | 查看原文 |
收录类别 | SCIE ; EI |
语种 | 英语 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4108643 |
专题 | 武汉大学 |
推荐引用方式 GB/T 7714 | Quan, Zuci,Zhang, Baishun,Zhang, Tianjin,et al. Interfacial characteristics and dielectric properties of Ba0.65Sr0.35TiO3 thin films[J]. THIN SOLID FILMS,2008,516(6). |
APA | Quan, Zuci.,Zhang, Baishun.,Zhang, Tianjin.,Zhao, Xingzhong.,Pan, Ruikun.,...&Jiang, Juan.(2008).Interfacial characteristics and dielectric properties of Ba0.65Sr0.35TiO3 thin films.THIN SOLID FILMS,516(6). |
MLA | Quan, Zuci,et al."Interfacial characteristics and dielectric properties of Ba0.65Sr0.35TiO3 thin films".THIN SOLID FILMS 516.6(2008). |
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