| Semi-supervised Software Defect Prediction Using Task-Driven Dictionary Learning | |
| Cheng Ming; Wu Guoqing; Yuan Mengting; Wan Hongyan | |
| 刊名 | CHINESE JOURNAL OF ELECTRONICS
 |
| 2016 | |
| 卷号 | 25期号:6 |
| 关键词 | Software defect prediction Task-driven dictionary learning Cost-sensitive Semi-supervised learning Sparse representation |
| ISSN号 | 1022-4653 |
| DOI | 10.1049/cje.2016.08.034 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE |
| 语种 | 英语 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4049213 |
| 专题 | 武汉大学 |
| 推荐引用方式 GB/T 7714 | Cheng Ming,Wu Guoqing,Yuan Mengting,et al. Semi-supervised Software Defect Prediction Using Task-Driven Dictionary Learning[J]. CHINESE JOURNAL OF ELECTRONICS,2016,25(6). |
| APA | Cheng Ming,Wu Guoqing,Yuan Mengting,&Wan Hongyan.(2016).Semi-supervised Software Defect Prediction Using Task-Driven Dictionary Learning.CHINESE JOURNAL OF ELECTRONICS,25(6). |
| MLA | Cheng Ming,et al."Semi-supervised Software Defect Prediction Using Task-Driven Dictionary Learning".CHINESE JOURNAL OF ELECTRONICS 25.6(2016). |
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