| Detecting edge degeneracy in interacting topological insulators through entanglement entropy | |
| Wang, Da; Xu, Shenglong; Wang, Yu; Wu, Congjun | |
| 刊名 | PHYSICAL REVIEW B
 |
| 2015 | |
| 卷号 | 91期号:11 |
| ISSN号 | 1098-0121 |
| DOI | 10.1103/PhysRevB.91.115118 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE |
| 语种 | 英语 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4041166 |
| 专题 | 武汉大学 |
| 推荐引用方式 GB/T 7714 | Wang, Da,Xu, Shenglong,Wang, Yu,et al. Detecting edge degeneracy in interacting topological insulators through entanglement entropy[J]. PHYSICAL REVIEW B,2015,91(11). |
| APA | Wang, Da,Xu, Shenglong,Wang, Yu,&Wu, Congjun.(2015).Detecting edge degeneracy in interacting topological insulators through entanglement entropy.PHYSICAL REVIEW B,91(11). |
| MLA | Wang, Da,et al."Detecting edge degeneracy in interacting topological insulators through entanglement entropy".PHYSICAL REVIEW B 91.11(2015). |
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