Total internal reflection imaging ellipsometry (TIRIE) biosensor sensitivity improvement with low noise imaging device

	Total internal reflection imaging ellipsometry (TIRIE) biosensor sensitivity improvement with low noise imaging device
	Liu L(刘丽); Jin G(靳刚)
	2011
会议名称	Conference on Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications XII
会议日期	JAN 25-27, 2011
通讯作者邮箱	gajin@imech.ac.cn
会议地点	San Francisco, CA
关键词	total internal reflection imaging ellipsometry biosensor
卷号	7875
页码	78750U
通讯作者	Jin, G (reprint author), Chinese Acad Sci, NML, Inst Mech, 15 Bei Si Huan W Rd, Beijing 100190, Peoples R China
中文摘要	The biosensors with properties of real-time, high throughput and label-free are more and more popular recently, in which the biosensor based on the total internal reflection imaging ellipsometry (TIRIE) is a novel imaging detector for protein interaction processes. In previous work, three techniques are introduced to improve the performance of the biosensor including polarization setting optimization, spectroscopic light source application and low noise CCD detector adoption. In this paper, the effect of the low noise CCD detector technology on the sensitivity and detection limit improvement is analyzed. An obvious improvement of 10 time increase in the sensitivity and SNR, and 50 times lower concentration in the detection limit is obtained by optimization.
收录类别	CPCI
产权排序	Chinese Acad Sci, NML, Inst Mech, Beijing 100190, Peoples R China
会议网址	http://dx.doi.org/10.1117/12.871978
会议录	SENSORS, CAMERAS, AND SYSTEMS FOR INDUSTRIAL, SCIENTIFIC, AND CONSUMER APPLICATIONS XII
会议录出版者	SPIE-INT SOC OPTICAL ENGINEERING
会议录出版地	1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
学科主题	Optics
语种	英语
ISSN号	0277-786X
ISBN号	978-0-8194-8412-3
内容类型	会议论文
源URL	[http://dspace.imech.ac.cn/handle/311007/45327]
专题	力学研究所_国家微重力实验室
推荐引用方式 GB/T 7714	Liu L,Jin G. Total internal reflection imaging ellipsometry (TIRIE) biosensor sensitivity improvement with low noise imaging device[C]. 见:Conference on Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications XII. San Francisco, CA. JAN 25-27, 2011.http://dx.doi.org/10.1117/12.871978.