| Quantifying the structural integrity of nanorod arrays | |
| Thoele, Florian; Xue, Longjian; Hess, Claudia; Hillebrand, Reinald; Gorb, Stanislav N.; Steinhart, Martin | |
| 刊名 | JOURNAL OF MICROSCOPY
 |
| 2017 | |
| 卷号 | 265期号:2 |
| 关键词 | Arrays clustering image analysis nanorods self-ordered nanoporous alumina scanning electron microscopy surfaces template synthesis |
| ISSN号 | 0022-2720 |
| DOI | 10.1111/jmi.12491 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE |
| 语种 | 英语 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/3893061 |
| 专题 | 武汉大学 |
| 推荐引用方式 GB/T 7714 | Thoele, Florian,Xue, Longjian,Hess, Claudia,et al. Quantifying the structural integrity of nanorod arrays[J]. JOURNAL OF MICROSCOPY,2017,265(2). |
| APA | Thoele, Florian,Xue, Longjian,Hess, Claudia,Hillebrand, Reinald,Gorb, Stanislav N.,&Steinhart, Martin.(2017).Quantifying the structural integrity of nanorod arrays.JOURNAL OF MICROSCOPY,265(2). |
| MLA | Thoele, Florian,et al."Quantifying the structural integrity of nanorod arrays".JOURNAL OF MICROSCOPY 265.2(2017). |
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