Raman spectra and XPS studies of phase changes in Ge2Sb2Te5 films

	Raman spectra and XPS studies of phase changes in Ge2Sb2Te5 films
	Liu, B ; Song, ZT ; Zhang, T ; Feng, SL ; Chen, BM
刊名	CHINESE PHYSICS
	2004
卷号	13 期号:11 页码:1947-1950
关键词	TRANSMISSION ELECTRON-MICROSCOPY CRYSTALLIZATION BEHAVIOR THIN-FILMS MEMORY SPECTROSCOPY TRANSITIONS MEDIA SB
ISSN号	1009-1963
通讯作者	Liu, B, Chinese Acad Sci, Res Ctr Funct Semicond Film Engn Technol, State Key Lab Funct Mat Informat, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China
学科主题	Physics, Multidisciplinary
收录类别	SCI
语种	英语
公开日期	2012-03-24
内容类型	期刊论文
源URL	[http://ir.sim.ac.cn/handle/331004/95464]
专题	上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式 GB/T 7714	Liu, B,Song, ZT,Zhang, T,et al. Raman spectra and XPS studies of phase changes in Ge2Sb2Te5 films[J]. CHINESE PHYSICS,2004,13(11):1947-1950.
APA	Liu, B,Song, ZT,Zhang, T,Feng, SL,&Chen, BM.(2004).Raman spectra and XPS studies of phase changes in Ge2Sb2Te5 films.CHINESE PHYSICS,13(11),1947-1950.
MLA	Liu, B,et al."Raman spectra and XPS studies of phase changes in Ge2Sb2Te5 films".CHINESE PHYSICS 13.11(2004):1947-1950.