BEHAVIOR OF TYPE-A AND TYPE-B HOLE TRAPS IN N-TYPE GAAS DURING LONG-PERIOD OPERATION

	BEHAVIOR OF TYPE-A AND TYPE-B HOLE TRAPS IN N-TYPE GAAS DURING LONG-PERIOD OPERATION
	ZHOU, JC ; ZHAN, QB ; FU, ZP ; LU, DL ; GUAN, LM ; CHEN, HQ
刊名	SOLID-STATE ELECTRONICS
	1992
卷号	35 期号:9 页码:1325-1329
关键词	LPE
ISSN号	0038-1101
通讯作者	ZHOU, JC, ACAD SINICA,SHANGHAI INST MET,865 CHANG NING RD,SHANGHAI 200050,PEOPLES R CHINA
学科主题	Engineering, Electrical & Electronic; Physics, Applied; Physics, Condensed Matter
收录类别	SCI
原文出处	http://www.sciencedirect.com/science/article/pii/003811019290167B
语种	英语
公开日期	2012-03-25
内容类型	期刊论文
源URL	[http://ir.sim.ac.cn/handle/331004/98411]
专题	上海微系统与信息技术研究所_功能材料与器件_期刊论文（1999年以前)
推荐引用方式 GB/T 7714	ZHOU, JC,ZHAN, QB,FU, ZP,et al. BEHAVIOR OF TYPE-A AND TYPE-B HOLE TRAPS IN N-TYPE GAAS DURING LONG-PERIOD OPERATION[J]. SOLID-STATE ELECTRONICS,1992,35(9):1325-1329.
APA	ZHOU, JC,ZHAN, QB,FU, ZP,LU, DL,GUAN, LM,&CHEN, HQ.(1992).BEHAVIOR OF TYPE-A AND TYPE-B HOLE TRAPS IN N-TYPE GAAS DURING LONG-PERIOD OPERATION.SOLID-STATE ELECTRONICS,35(9),1325-1329.
MLA	ZHOU, JC,et al."BEHAVIOR OF TYPE-A AND TYPE-B HOLE TRAPS IN N-TYPE GAAS DURING LONG-PERIOD OPERATION".SOLID-STATE ELECTRONICS 35.9(1992):1325-1329.