Defect characterization in thermoelectric Zn-Sb systems by Positron annihilation | |
Zhou, Kai; Chen, Z.Q.; Zhang, Ting | |
刊名 | Defect and Diffusion Forum
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2016 | |
卷号 | 373 DDF |
ISSN号 | 1012-0386 |
DOI | 10.4028/www.scientific.net/DDF.373.245 |
URL标识 | 查看原文 |
收录类别 | EI |
语种 | 英语 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/3741172 |
专题 | 武汉大学 |
推荐引用方式 GB/T 7714 | Zhou, Kai,Chen, Z.Q.,Zhang, Ting. Defect characterization in thermoelectric Zn-Sb systems by Positron annihilation[J]. Defect and Diffusion Forum,2016,373 DDF. |
APA | Zhou, Kai,Chen, Z.Q.,&Zhang, Ting.(2016).Defect characterization in thermoelectric Zn-Sb systems by Positron annihilation.Defect and Diffusion Forum,373 DDF. |
MLA | Zhou, Kai,et al."Defect characterization in thermoelectric Zn-Sb systems by Positron annihilation".Defect and Diffusion Forum 373 DDF(2016). |
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