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	A grid-base line analysis for street occlusion removal and building facade texturing
	Liu, Yawen; Guan, Zhen
刊名	American Society for Photogrammetry and Remote Sensing Annual Conference 2010: Opportunities for Emerging Geospatial Technologies
	2010
卷号	2
URL标识	查看原文
收录类别	EI
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3735865
专题	武汉大学
推荐引用方式 GB/T 7714	Liu, Yawen,Guan, Zhen. A grid-base line analysis for street occlusion removal and building facade texturing[J]. American Society for Photogrammetry and Remote Sensing Annual Conference 2010: Opportunities for Emerging Geospatial Technologies,2010,2.
APA	Liu, Yawen,&Guan, Zhen.(2010).A grid-base line analysis for street occlusion removal and building facade texturing.American Society for Photogrammetry and Remote Sensing Annual Conference 2010: Opportunities for Emerging Geospatial Technologies,2.
MLA	Liu, Yawen,et al."A grid-base line analysis for street occlusion removal and building facade texturing".American Society for Photogrammetry and Remote Sensing Annual Conference 2010: Opportunities for Emerging Geospatial Technologies 2(2010).

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