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Cross-project and within-project semi-supervised software defect prediction problems study using a unified solution
Xu, Mingwei; Cao, Jicheng; Dong, Xiwei; Jing, Xiao-Yuan; Wu, Fei; Ying, Shi; Xu, Baowen; Zhang, Hongyu
刊名Proceedings - 2017 IEEE/ACM 39th International Conference on Software Engineering Companion, ICSE-C 2017
2017
DOI10.1109/ICSE-C.2017.72
URL标识查看原文
收录类别EI
语种英语
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/3735074
专题武汉大学
推荐引用方式
GB/T 7714
Xu, Mingwei,Cao, Jicheng,Dong, Xiwei,et al. Cross-project and within-project semi-supervised software defect prediction problems study using a unified solution[J]. Proceedings - 2017 IEEE/ACM 39th International Conference on Software Engineering Companion, ICSE-C 2017,2017.
APA Xu, Mingwei.,Cao, Jicheng.,Dong, Xiwei.,Jing, Xiao-Yuan.,Wu, Fei.,...&Zhang, Hongyu.(2017).Cross-project and within-project semi-supervised software defect prediction problems study using a unified solution.Proceedings - 2017 IEEE/ACM 39th International Conference on Software Engineering Companion, ICSE-C 2017.
MLA Xu, Mingwei,et al."Cross-project and within-project semi-supervised software defect prediction problems study using a unified solution".Proceedings - 2017 IEEE/ACM 39th International Conference on Software Engineering Companion, ICSE-C 2017 (2017).
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