Defects in ZnO thin films grown on ScAlMgO4 substrates probed by a monoenergetic positron beam | |
Uedono, A.; Koida, T.; Tsukazaki, A.; Kawasaki, M.; Chen, Z.Q.; Chichibu, S.F.; Koinuma, H. | |
刊名 | Journal of Applied Physics
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2003 | |
卷号 | 93期号:5 |
ISSN号 | 0021-8979 |
DOI | 10.1063/1.1539915 |
URL标识 | 查看原文 |
收录类别 | EI |
语种 | 英语 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/3732716 |
专题 | 武汉大学 |
推荐引用方式 GB/T 7714 | Uedono, A.,Koida, T.,Tsukazaki, A.,et al. Defects in ZnO thin films grown on ScAlMgO4 substrates probed by a monoenergetic positron beam[J]. Journal of Applied Physics,2003,93(5). |
APA | Uedono, A..,Koida, T..,Tsukazaki, A..,Kawasaki, M..,Chen, Z.Q..,...&Koinuma, H..(2003).Defects in ZnO thin films grown on ScAlMgO4 substrates probed by a monoenergetic positron beam.Journal of Applied Physics,93(5). |
MLA | Uedono, A.,et al."Defects in ZnO thin films grown on ScAlMgO4 substrates probed by a monoenergetic positron beam".Journal of Applied Physics 93.5(2003). |
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