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	Study on Si-PIN and CdTe Detectors Used in Energy Dispersive X-Ray Fluorescence Measurements
	Hu Chuan-hao; Zeng Guo-qiang; Ge Liang-quan; Yu Ming-fu; Wei Shi-long; Zhang Kai-qi; Yang Jian; Chen Chuan
	2017
卷号	37页码:262-266
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3731107
专题	成都理工大学
作者单位	[1]Chengdu Univ Technol, Nucl Technol & Automat Engn Coll, Chengdu 610059, Peoples R China
推荐引用方式 GB/T 7714	Hu Chuan-hao,Zeng Guo-qiang,Ge Liang-quan,et al. Study on Si-PIN and CdTe Detectors Used in Energy Dispersive X-Ray Fluorescence Measurements[J],2017,37:262-266.
APA	Hu Chuan-hao.,Zeng Guo-qiang.,Ge Liang-quan.,Yu Ming-fu.,Wei Shi-long.,...&Chen Chuan.(2017).Study on Si-PIN and CdTe Detectors Used in Energy Dispersive X-Ray Fluorescence Measurements.,37,262-266.
MLA	Hu Chuan-hao,et al."Study on Si-PIN and CdTe Detectors Used in Energy Dispersive X-Ray Fluorescence Measurements".37(2017):262-266.

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