| Expected Bayesian Credible Limit of Reliability Parameters in the Case of Zero -Failure Data for Exponential Distribution | |
| Tianqun, Xu; Yuepeng, Chen; Tianhe, Xu; Huanbin, Liu | |
| 2011 | |
| 会议名称 | 23rd Chinese Control and Decision Conference |
| 会议日期 | MAY 23-25, 2011 |
| 会议地点 | Mianyang, PEOPLES R CHINA |
| 关键词 | zero-failure data failure rate reliability E-Bayesian credible limit exponential distribution |
| DOI | 10.1109/CCDC.2011.5968800 |
| 页码 | 3163-3168 |
| 会议录 | Proceedings of the 2011 Chinese Control and Decision Conference, CCDC 2011
 |
| URL标识 | 查看原文 |
| ISSN号 | 1948-9439 |
| WOS记录号 | WOS:000323234702053;EI:20113614295149 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/3398898 |
| 专题 | 武汉理工大学 |
| 作者单位 | [Tianqun, Xu] Wuhan Univ Technol, Sch Sci, Wuhan 430070, Hubei, Peoples R China. |
| 推荐引用方式 GB/T 7714 | Tianqun, Xu,Yuepeng, Chen,Tianhe, Xu,et al. Expected Bayesian Credible Limit of Reliability Parameters in the Case of Zero -Failure Data for Exponential Distribution[C]. 见:23rd Chinese Control and Decision Conference. Mianyang, PEOPLES R CHINA. MAY 23-25, 2011. |
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