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Impact of the Wire Tightness Degree on Circular Pad with Different Coil Size in IPT System
Li, Wenjing*; Lu, Jianghua; Li, Bo; Zhu, Guorong; Chen, Wu
2017
会议名称3rd IEEE International Future Energy Electronics Conference and ECCE Asia
会议日期JUN 03-07, 2017
会议地点Kaohsiung, TAIWAN
关键词circular pad FEA IPT sensibility wire tightness degree
页码2273-2278
会议录2017 IEEE 3RD INTERNATIONAL FUTURE ENERGY ELECTRONICS CONFERENCE AND ECCE ASIA (IFEEC 2017-ECCE ASIA)
URL标识查看原文
WOS记录号WOS:000426696300405
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/3397568
专题武汉理工大学
作者单位1.[Li, Bo
2.Li, Wenjing
3.Zhu, Guorong
4.Lu, Jianghua] Wuhan Univ Technol, Sch Automat, Wuhan, Hubei, Peoples R China.
推荐引用方式
GB/T 7714
Li, Wenjing*,Lu, Jianghua,Li, Bo,et al. Impact of the Wire Tightness Degree on Circular Pad with Different Coil Size in IPT System[C]. 见:3rd IEEE International Future Energy Electronics Conference and ECCE Asia. Kaohsiung, TAIWAN. JUN 03-07, 2017.
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