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Improved performance of top-gated multilayer MoS2 transistors with channel fully encapsulated by Al2O3 dielectric
Zou, Jiyue; Wang, Lisheng*; Chen, Fengxiang*
刊名AIP ADVANCES
2019
卷号9期号:9
ISSN号2158-3226
DOI10.1063/1.5119913
URL标识查看原文
WOS记录号WOS:000488516200081
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/3390733
专题武汉理工大学
作者单位[Zou, Jiyue] Wuhan Univ Technol, Sch Informat Engn, Wuhan 430070, Hubei, Peoples R China.
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Zou, Jiyue,Wang, Lisheng*,Chen, Fengxiang*. Improved performance of top-gated multilayer MoS2 transistors with channel fully encapsulated by Al2O3 dielectric[J]. AIP ADVANCES,2019,9(9).
APA Zou, Jiyue,Wang, Lisheng*,&Chen, Fengxiang*.(2019).Improved performance of top-gated multilayer MoS2 transistors with channel fully encapsulated by Al2O3 dielectric.AIP ADVANCES,9(9).
MLA Zou, Jiyue,et al."Improved performance of top-gated multilayer MoS2 transistors with channel fully encapsulated by Al2O3 dielectric".AIP ADVANCES 9.9(2019).
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