Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution | |
Xu, Tian-Qun; Chen, Yue-Peng* | |
刊名 | Applied Mathematical Modelling
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2014 | |
卷号 | 38期号:9-10页码:2586-2600 |
关键词 | Exponential distribution Failure rate Reliability Two-sided M-Bayesian credible limit Zero-failure data |
ISSN号 | 0307-904X |
DOI | 10.1016/j.apm.2013.10.054 |
URL标识 | 查看原文 |
WOS记录号 | WOS:000335636000021;EI:20141617595096 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/3380883 |
专题 | 武汉理工大学 |
作者单位 | [Xu, Tian-Qun] Wuhan Univ Technol, Sch Sci, Wuhan 430070, Hubei, Peoples R China. |
推荐引用方式 GB/T 7714 | Xu, Tian-Qun,Chen, Yue-Peng*. Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution[J]. Applied Mathematical Modelling,2014,38(9-10):2586-2600. |
APA | Xu, Tian-Qun,&Chen, Yue-Peng*.(2014).Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution.Applied Mathematical Modelling,38(9-10),2586-2600. |
MLA | Xu, Tian-Qun,et al."Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution".Applied Mathematical Modelling 38.9-10(2014):2586-2600. |
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