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Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution
Xu, Tian-Qun; Chen, Yue-Peng*
刊名Applied Mathematical Modelling
2014
卷号38期号:9-10页码:2586-2600
关键词Exponential distribution Failure rate Reliability Two-sided M-Bayesian credible limit Zero-failure data
ISSN号0307-904X
DOI10.1016/j.apm.2013.10.054
URL标识查看原文
WOS记录号WOS:000335636000021;EI:20141617595096
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/3380883
专题武汉理工大学
作者单位[Xu, Tian-Qun] Wuhan Univ Technol, Sch Sci, Wuhan 430070, Hubei, Peoples R China.
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Xu, Tian-Qun,Chen, Yue-Peng*. Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution[J]. Applied Mathematical Modelling,2014,38(9-10):2586-2600.
APA Xu, Tian-Qun,&Chen, Yue-Peng*.(2014).Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution.Applied Mathematical Modelling,38(9-10),2586-2600.
MLA Xu, Tian-Qun,et al."Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution".Applied Mathematical Modelling 38.9-10(2014):2586-2600.
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