CORC  > 武汉理工大学
In Situ Irradiated X-Ray Photoelectron Spectroscopy Investigation on a Direct Z-Scheme TiO2 /CdS Composite Film Photocatalyst.
Low, Jingxiang; Dai, Benzhe; Tong, Tong; Jiang, Chuanjia; Yu, Jiaguo*
刊名Advanced materials (Deerfield Beach, Fla.)
2019
卷号31期号:6页码:e1807920
关键词CO2 reduction CdS direct Z-scheme photocatalysts photocatalysis porous TiO2
ISSN号1521-4095
DOI10.1002/adma.201802981
URL标识查看原文
WOS记录号WOS:000459630600002;PMID:30345599
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/3370146
专题武汉理工大学
作者单位1.[Low, Jingxiang
2.Tong, Tong
3.Yu, Jiaguo
4.Dai, Benzhe] Wuhan Univ Technol, State Key Lab Adv Technol Mat Synth & Proc, 122 Luoshi Rd, Wuhan 430070, Hubei, Peoples R China.
推荐引用方式
GB/T 7714
Low, Jingxiang,Dai, Benzhe,Tong, Tong,et al. In Situ Irradiated X-Ray Photoelectron Spectroscopy Investigation on a Direct Z-Scheme TiO2 /CdS Composite Film Photocatalyst.[J]. Advanced materials (Deerfield Beach, Fla.),2019,31(6):e1807920.
APA Low, Jingxiang,Dai, Benzhe,Tong, Tong,Jiang, Chuanjia,&Yu, Jiaguo*.(2019).In Situ Irradiated X-Ray Photoelectron Spectroscopy Investigation on a Direct Z-Scheme TiO2 /CdS Composite Film Photocatalyst..Advanced materials (Deerfield Beach, Fla.),31(6),e1807920.
MLA Low, Jingxiang,et al."In Situ Irradiated X-Ray Photoelectron Spectroscopy Investigation on a Direct Z-Scheme TiO2 /CdS Composite Film Photocatalyst.".Advanced materials (Deerfield Beach, Fla.) 31.6(2019):e1807920.
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace