Research on double-probe, double- and triple-tip effects during atomic force microscopy scanning | |
Chen, Yong[1]; Cai, Jiye[1]; Liu, Meili[1]; Zeng, Gucheng[1]; Feng, Qian[1]; Chen, Zhengwei[2] | |
2004 | |
卷号 | 26期号:[db:dc_citation_issue]页码:155 |
DOI | [db:dc_identifier_doi] |
URL标识 | 查看原文 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/3358293 |
专题 | 暨南大学 |
作者单位 | 1.[1]Jinan Univ, Dept Chem, Guangzhou, Guangdong, Peoples R China 2.[2]Harvard Univ, Beth Israel Deaconess Med Ctr, Sch Med, Boston, MA 02215 USA |
推荐引用方式 GB/T 7714 | Chen, Yong[1],Cai, Jiye[1],Liu, Meili[1],et al. Research on double-probe, double- and triple-tip effects during atomic force microscopy scanning[J],2004,26([db:dc_citation_issue]):155. |
APA | Chen, Yong[1],Cai, Jiye[1],Liu, Meili[1],Zeng, Gucheng[1],Feng, Qian[1],&Chen, Zhengwei[2].(2004).Research on double-probe, double- and triple-tip effects during atomic force microscopy scanning.,26([db:dc_citation_issue]),155. |
MLA | Chen, Yong[1],et al."Research on double-probe, double- and triple-tip effects during atomic force microscopy scanning".26.[db:dc_citation_issue](2004):155. |
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