QQ客服 官方微博 反馈留言

	Research on double-probe, double- and triple-tip effects during atomic force microscopy scanning
	Chen, Yong[1]; Cai, Jiye[1]; Liu, Meili[1]; Zeng, Gucheng[1]; Feng, Qian[1]; Chen, Zhengwei[2]
	2004
卷号	26期号:[db:dc_citation_issue]页码:155
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3358293
专题	暨南大学
作者单位	1.[1]Jinan Univ, Dept Chem, Guangzhou, Guangdong, Peoples R China 2.[2]Harvard Univ, Beth Israel Deaconess Med Ctr, Sch Med, Boston, MA 02215 USA
推荐引用方式 GB/T 7714	Chen, Yong[1],Cai, Jiye[1],Liu, Meili[1],et al. Research on double-probe, double- and triple-tip effects during atomic force microscopy scanning[J],2004,26([db:dc_citation_issue]):155.
APA	Chen, Yong[1],Cai, Jiye[1],Liu, Meili[1],Zeng, Gucheng[1],Feng, Qian[1],&Chen, Zhengwei[2].(2004).Research on double-probe, double- and triple-tip effects during atomic force microscopy scanning.,26([db:dc_citation_issue]),155.
MLA	Chen, Yong[1],et al."Research on double-probe, double- and triple-tip effects during atomic force microscopy scanning".26.[db:dc_citation_issue](2004):155.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。