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	A low power test pattern generation method
	Zhang, Guohe; Ji, Lili; Zhang, Linlin; Lei, Shaochong; Liang, Feng
刊名	Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University
	2013
卷号	47期号:[db:dc_citation_issue]页码:47-52
关键词	Hardware overheads Linear feedback shift registers Low Power Low power test Low transition Power overhead Pseudo-random tests Reconfigurable Single input changes Test Pattern Test pattern generations Test pattern generator Test power VLSI tests
ISSN号	0253-987X
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3307427
专题	西安交通大学
推荐引用方式 GB/T 7714	Zhang, Guohe,Ji, Lili,Zhang, Linlin,et al. A low power test pattern generation method[J]. Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University,2013,47([db:dc_citation_issue]):47-52.
APA	Zhang, Guohe,Ji, Lili,Zhang, Linlin,Lei, Shaochong,&Liang, Feng.(2013).A low power test pattern generation method.Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University,47([db:dc_citation_issue]),47-52.
MLA	Zhang, Guohe,et al."A low power test pattern generation method".Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University 47.[db:dc_citation_issue](2013):47-52.

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