Technology Opportunity Analysis based on Patent analysis in the Industrial Robot field | |
Chen Y(陈悦); Liu ZY(刘则渊) | |
2017 | |
会议名称 | 13th International Conference on Webometrics, Informetrics and Scientometrics & 18th COLLNET Meeting |
页码 | - |
会议录 | 13th International Conference on Webometrics, Informetrics and Scientometrics & 18th COLLNET Meeting
![]() |
URL标识 | 查看原文 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/3289678 |
专题 | 大连理工大学 |
推荐引用方式 GB/T 7714 | Chen Y,Liu ZY. Technology Opportunity Analysis based on Patent analysis in the Industrial Robot field[C]. 见:13th International Conference on Webometrics, Informetrics and Scientometrics & 18th COLLNET Meeting. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论