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Technology Opportunity Analysis based on Patent analysis in the Industrial Robot field
Chen Y(陈悦); Liu ZY(刘则渊)
2017
会议名称13th International Conference on Webometrics, Informetrics and Scientometrics & 18th COLLNET Meeting
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会议录13th International Conference on Webometrics, Informetrics and Scientometrics & 18th COLLNET Meeting
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WOS记录号[DB:DC_IDENTIFIER_WOSID]
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/3289678
专题大连理工大学
推荐引用方式
GB/T 7714
Chen Y,Liu ZY. Technology Opportunity Analysis based on Patent analysis in the Industrial Robot field[C]. 见:13th International Conference on Webometrics, Informetrics and Scientometrics & 18th COLLNET Meeting.
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