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Simplified low-temperature wafer-level hybrid bonding using pillar bump and photosensitive adhesive for three-dimensional integrated circuit integration
Yao, Mingjun; Fan, Jun; Zhao, Ning; Xiao, Zhiyi; Yu, Daquan; Ma, Haitao
刊名JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
2017
卷号28页码:9091-9095
ISSN号0957-4522
URL标识查看原文
WOS记录号[DB:DC_IDENTIFIER_WOSID]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/3283902
专题大连理工大学
作者单位1.Dalian Univ Technol, Sch Mat Sci & Engn, Dalian 116024, Peoples R China.
2.Huatian Technol Kunshan Elect Co Ltd, Kunshan 215300, Peoples R China.
推荐引用方式
GB/T 7714
Yao, Mingjun,Fan, Jun,Zhao, Ning,et al. Simplified low-temperature wafer-level hybrid bonding using pillar bump and photosensitive adhesive for three-dimensional integrated circuit integration[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2017,28:9091-9095.
APA Yao, Mingjun,Fan, Jun,Zhao, Ning,Xiao, Zhiyi,Yu, Daquan,&Ma, Haitao.(2017).Simplified low-temperature wafer-level hybrid bonding using pillar bump and photosensitive adhesive for three-dimensional integrated circuit integration.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,28,9091-9095.
MLA Yao, Mingjun,et al."Simplified low-temperature wafer-level hybrid bonding using pillar bump and photosensitive adhesive for three-dimensional integrated circuit integration".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 28(2017):9091-9095.
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