Propagation characteristics of microstrip lines with 2D defected ground structures | |
Liu,HW ; Sun,XW ; Li,ZF ; Yoshimasu,T | |
刊名 | INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING
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2006 | |
卷号 | 16期号:3页码:280-286 |
关键词 | TRANSMISSION-LINES PLANAR CIRCUITS SIZE |
ISSN号 | 1096-4290 |
通讯作者 | Liu, HW, Shanghai Jiao Tong Univ, Dept Elect Engn, Shanghai 200030, Peoples R China |
学科主题 | Computer Science ; Interdisciplinary Applications; Engineering ; Electrical & Electronic |
收录类别 | SCI |
公开日期 | 2011-12-17 |
内容类型 | 期刊论文 |
源URL | [http://ir.sim.ac.cn/handle/331004/39055] ![]() |
专题 | 上海微系统与信息技术研究所_太赫兹、微波射频技术_期刊论文 |
推荐引用方式 GB/T 7714 | Liu,HW,Sun,XW,Li,ZF,et al. Propagation characteristics of microstrip lines with 2D defected ground structures[J]. INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING,2006,16(3):280-286. |
APA | Liu,HW,Sun,XW,Li,ZF,&Yoshimasu,T.(2006).Propagation characteristics of microstrip lines with 2D defected ground structures.INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING,16(3),280-286. |
MLA | Liu,HW,et al."Propagation characteristics of microstrip lines with 2D defected ground structures".INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING 16.3(2006):280-286. |
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