Propagation characteristics of microstrip lines with 2D defected ground structures

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	Propagation characteristics of microstrip lines with 2D defected ground structures
	Liu,HW ; Sun,XW ; Li,ZF ; Yoshimasu,T
刊名	INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING
	2006
卷号	16 期号:3 页码:280-286
关键词	TRANSMISSION-LINES PLANAR CIRCUITS SIZE
ISSN号	1096-4290
通讯作者	Liu, HW, Shanghai Jiao Tong Univ, Dept Elect Engn, Shanghai 200030, Peoples R China
学科主题	Computer Science ; Interdisciplinary Applications; Engineering ; Electrical & Electronic
收录类别	SCI
公开日期	2011-12-17
内容类型	期刊论文
源URL	[http://ir.sim.ac.cn/handle/331004/39055]
专题	上海微系统与信息技术研究所_太赫兹、微波射频技术_期刊论文
推荐引用方式 GB/T 7714	Liu,HW,Sun,XW,Li,ZF,et al. Propagation characteristics of microstrip lines with 2D defected ground structures[J]. INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING,2006,16(3):280-286.
APA	Liu,HW,Sun,XW,Li,ZF,&Yoshimasu,T.(2006).Propagation characteristics of microstrip lines with 2D defected ground structures.INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING,16(3),280-286.
MLA	Liu,HW,et al."Propagation characteristics of microstrip lines with 2D defected ground structures".INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING 16.3(2006):280-286.