Performance degradation of some on-chip finite-ground coplanar waveguide (FGCPW)-built passive devices at high temperature | |
Yin,WY ; Mao,JF ; Shi,JL ; Sun,XW | |
刊名 | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
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2006 | |
卷号 | 48期号:9页码:1754-1759 |
关键词 | COMPLEX PERMITTIVITY GAAS-MESFETS DEPENDENCE INDUCTORS MODEL |
ISSN号 | 0895-2477 |
通讯作者 | Yin, WY, Shanghai Jiao Tong Univ, Sch Elect Informat & Elect Engn, Ctr Microwave & RF Technol, Shanghai 200240, Peoples R China |
学科主题 | Engineering ; Electrical & Electronic; Optics |
收录类别 | SCI |
公开日期 | 2011-12-17 |
内容类型 | 期刊论文 |
源URL | [http://ir.sim.ac.cn/handle/331004/39027] ![]() |
专题 | 上海微系统与信息技术研究所_太赫兹、微波射频技术_期刊论文 |
推荐引用方式 GB/T 7714 | Yin,WY,Mao,JF,Shi,JL,et al. Performance degradation of some on-chip finite-ground coplanar waveguide (FGCPW)-built passive devices at high temperature[J]. MICROWAVE AND OPTICAL TECHNOLOGY LETTERS,2006,48(9):1754-1759. |
APA | Yin,WY,Mao,JF,Shi,JL,&Sun,XW.(2006).Performance degradation of some on-chip finite-ground coplanar waveguide (FGCPW)-built passive devices at high temperature.MICROWAVE AND OPTICAL TECHNOLOGY LETTERS,48(9),1754-1759. |
MLA | Yin,WY,et al."Performance degradation of some on-chip finite-ground coplanar waveguide (FGCPW)-built passive devices at high temperature".MICROWAVE AND OPTICAL TECHNOLOGY LETTERS 48.9(2006):1754-1759. |
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