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	Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films
	Ke, Qingqing; Kumar, Amit; Lou, Xiaojie; Feng, Yuan Ping; Zeng, Kaiyang; Cai, Yongqing; Wang, John
刊名	ACTA MATERIALIA
	2015
卷号	82期号:[db:dc_citation_issue]页码:190-197
关键词	Oxygen vacancy clusters Fatigue Charged domain wall BiFeO3 Grain boundaries
ISSN号	1359-6454
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3270580
专题	西安交通大学
推荐引用方式 GB/T 7714	Ke, Qingqing,Kumar, Amit,Lou, Xiaojie,et al. Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films[J]. ACTA MATERIALIA,2015,82([db:dc_citation_issue]):190-197.
APA	Ke, Qingqing.,Kumar, Amit.,Lou, Xiaojie.,Feng, Yuan Ping.,Zeng, Kaiyang.,...&Wang, John.(2015).Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films.ACTA MATERIALIA,82([db:dc_citation_issue]),190-197.
MLA	Ke, Qingqing,et al."Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films".ACTA MATERIALIA 82.[db:dc_citation_issue](2015):190-197.

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