Effect of sputtering power on properties of ZnO thin film transistors with Bi15Zn1.0Nb1.5O7 gate insulator | |
Ye, Wei; Ren, Wei; Shi, Peng; Yang, Shuming; Jing, Weixuan; Jiang, Zhuangde; Wu, Xiaoqing | |
刊名 | CERAMICS INTERNATIONAL
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2015 | |
卷号 | 41期号:[db:dc_citation_issue]页码:S750-S757 |
关键词 | BZN pyrochlore thin film RF magnetron sputtering ZnO-TFTs |
ISSN号 | 0272-8842 |
DOI | [db:dc_identifier_doi] |
URL标识 | 查看原文 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/3269110 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Ye, Wei,Ren, Wei,Shi, Peng,et al. Effect of sputtering power on properties of ZnO thin film transistors with Bi15Zn1.0Nb1.5O7 gate insulator[J]. CERAMICS INTERNATIONAL,2015,41([db:dc_citation_issue]):S750-S757. |
APA | Ye, Wei.,Ren, Wei.,Shi, Peng.,Yang, Shuming.,Jing, Weixuan.,...&Wu, Xiaoqing.(2015).Effect of sputtering power on properties of ZnO thin film transistors with Bi15Zn1.0Nb1.5O7 gate insulator.CERAMICS INTERNATIONAL,41([db:dc_citation_issue]),S750-S757. |
MLA | Ye, Wei,et al."Effect of sputtering power on properties of ZnO thin film transistors with Bi15Zn1.0Nb1.5O7 gate insulator".CERAMICS INTERNATIONAL 41.[db:dc_citation_issue](2015):S750-S757. |
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