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	Structural and Electronic Properties of BaO/MgO(001)-type Interface Studied via Aberration-corrected Transmission Electron Microscopy and First-principles Calculations
	Deng, Lei; Mi, Shaobo; Chen, Dong; Wang, Yuanming; Ma, Xiuliang
刊名	JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
	2015
卷号	31期号:[db:dc_citation_issue]页码:205-209
关键词	Interface Transmission electron microscopy Thin films First-principles calculations
ISSN号	1005-0302
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3267371
专题	西安交通大学
推荐引用方式 GB/T 7714	Deng, Lei,Mi, Shaobo,Chen, Dong,et al. Structural and Electronic Properties of BaO/MgO(001)-type Interface Studied via Aberration-corrected Transmission Electron Microscopy and First-principles Calculations[J]. JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,2015,31([db:dc_citation_issue]):205-209.
APA	Deng, Lei,Mi, Shaobo,Chen, Dong,Wang, Yuanming,&Ma, Xiuliang.(2015).Structural and Electronic Properties of BaO/MgO(001)-type Interface Studied via Aberration-corrected Transmission Electron Microscopy and First-principles Calculations.JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,31([db:dc_citation_issue]),205-209.
MLA	Deng, Lei,et al."Structural and Electronic Properties of BaO/MgO(001)-type Interface Studied via Aberration-corrected Transmission Electron Microscopy and First-principles Calculations".JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY 31.[db:dc_citation_issue](2015):205-209.

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