| A semi-automated real-time gamma radiation response measurement system for semiconductor device characterisation | |
| Mu Yifei; Qi Yanfei; Lam Sang; Zhao Cezhou | |
| 2015 | |
| 关键词 | real-time radiation effects I-V and C-V characteristics gamma irradiation radiation response automated measurement system MOS capacitors |
| 期号 | [db:dc_citation_issue] |
| DOI | [db:dc_identifier_doi] |
| 页码 | 726-730 |
| 会议录 | PROCEEDINGS OF 2015 IEEE 12TH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS (ICEMI), VOL. 2
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| URL标识 | 查看原文 |
| ISSN号 | 9781479976195 |
| WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/3264919 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Mu Yifei,Qi Yanfei,Lam Sang,et al. A semi-automated real-time gamma radiation response measurement system for semiconductor device characterisation[C]. 见:. |
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