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	Investigation of InGaN Layer Grown Under In-Rich Condition by Reflectance Difference Spectroscopy Microscope
	Zheng, Xiantong; Huang, Wei; Liang, Hongwei; Wang, Ping; Liu, Yu; Chen, Zhaoying; Liang, Ping; Li, Mo; Zhang, Jian; Chen, Yonghai
刊名	JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
	2018
卷号	18页码:7468-7472
关键词	InGaN Microplates mu-RDS
ISSN号	1533-4880
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3258788
专题	大连理工大学
作者单位	1.Dalian Univ Technol, Sch Phys, Dalian 116024, Peoples R China. 2.Peking Univ, Sch Phys, State Key Lab Artificial Microstruct & Mesoscop P, Beijing 100871, Peoples R China. 3.Chinese Acad Sci, Inst Semicond, Beijing Key Lab Low Dimens Semicond Mat & Devices, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China. 4.Univ Chinese Acad Sci, Coll Mat Sci & Optoelect Technol, Beijing 100049, Peoples R China. 5.Dalian Univ Technol, Sch Phys, Dalian 116024, Peoples R China. 6.Dalian Univ Technol, Sch Microelect, Dalian 116024, Peoples R China. 7.Peking Univ, Sch Phys, State Key Lab Artificial Microstruct & Mesoscop P, Beijing 100871, Peoples R China. 8.Univ Chinese Acad Sci, Coll Mat Sci & Optoelect Technol, Beijing 100049, Peoples R China. 9.Chinese Acad Sci, Inst Semicond, Beijing Key Lab Low Dimens Semicond Mat & Devices, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China. 10.CAEP, Microsyst & Terahertz Res Ctr, 596 Yinhe Rd, Chengdu 610200, Sichuan, Peoples R China.
推荐引用方式 GB/T 7714	Zheng, Xiantong,Huang, Wei,Liang, Hongwei,et al. Investigation of InGaN Layer Grown Under In-Rich Condition by Reflectance Difference Spectroscopy Microscope[J]. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY,2018,18:7468-7472.
APA	Zheng, Xiantong.,Huang, Wei.,Liang, Hongwei.,Wang, Ping.,Liu, Yu.,...&Wang, Xinqiang.(2018).Investigation of InGaN Layer Grown Under In-Rich Condition by Reflectance Difference Spectroscopy Microscope.JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY,18,7468-7472.
MLA	Zheng, Xiantong,et al."Investigation of InGaN Layer Grown Under In-Rich Condition by Reflectance Difference Spectroscopy Microscope".JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY 18(2018):7468-7472.

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