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Optimization and Characterization of Low-Temperature Wafer-Level Hybrid Bonding Using Photopatternable Dry Film Adhesive and Symmetric Micro Cu Pillar Solder Bumps
Yao, Mingjun; Zhao, Ning; Wang, Teng; Yu, Daquan; Xiao, Zhiyi; Ma, Haitao
刊名IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY
2018
卷号8页码:1855-1862
关键词3-D IC bump dry film adhesive wafer-level hybrid bonding
ISSN号2156-3950
URL标识查看原文
WOS记录号[DB:DC_IDENTIFIER_WOSID]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/3258527
专题大连理工大学
作者单位1.Dalian Univ Technol, Sch Mat Sci & Engn, Dalian 116024, Peoples R China.
2.Huatian Technol Kunshan Elect Co Ltd, Kunshan 215300, Peoples R China.
推荐引用方式
GB/T 7714
Yao, Mingjun,Zhao, Ning,Wang, Teng,et al. Optimization and Characterization of Low-Temperature Wafer-Level Hybrid Bonding Using Photopatternable Dry Film Adhesive and Symmetric Micro Cu Pillar Solder Bumps[J]. IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY,2018,8:1855-1862.
APA Yao, Mingjun,Zhao, Ning,Wang, Teng,Yu, Daquan,Xiao, Zhiyi,&Ma, Haitao.(2018).Optimization and Characterization of Low-Temperature Wafer-Level Hybrid Bonding Using Photopatternable Dry Film Adhesive and Symmetric Micro Cu Pillar Solder Bumps.IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY,8,1855-1862.
MLA Yao, Mingjun,et al."Optimization and Characterization of Low-Temperature Wafer-Level Hybrid Bonding Using Photopatternable Dry Film Adhesive and Symmetric Micro Cu Pillar Solder Bumps".IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY 8(2018):1855-1862.
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