Current-voltage characterization of epitaxial grown barium titanate thin films on Si substrate | |
Wu, Zhigang; Bian, Jihong; Wang, Zhiguang; Wu, Zhongyu; Yang, Yaodong | |
刊名 | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS |
2015 | |
卷号 | 26期号:[db:dc_citation_issue]页码:8315-8318 |
ISSN号 | 0957-4522 |
DOI | [db:dc_identifier_doi] |
URL标识 | 查看原文 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/3246326 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Wu, Zhigang,Bian, Jihong,Wang, Zhiguang,et al. Current-voltage characterization of epitaxial grown barium titanate thin films on Si substrate[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2015,26([db:dc_citation_issue]):8315-8318. |
APA | Wu, Zhigang,Bian, Jihong,Wang, Zhiguang,Wu, Zhongyu,&Yang, Yaodong.(2015).Current-voltage characterization of epitaxial grown barium titanate thin films on Si substrate.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,26([db:dc_citation_issue]),8315-8318. |
MLA | Wu, Zhigang,et al."Current-voltage characterization of epitaxial grown barium titanate thin films on Si substrate".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 26.[db:dc_citation_issue](2015):8315-8318. |
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