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	Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters
	Shen, Zhihua; Wang, Xiao; Wu, Shengli; Tian, JinShou
刊名	JOURNAL OF MICROMECHANICS AND MICROENGINEERING
	2016
卷号	26期号:[db:dc_citation_issue]
关键词	nanometer-scale fissure surface-conduction electron emitter finite integration technique (FIT)
ISSN号	0960-1317
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3226549
专题	西安交通大学
推荐引用方式 GB/T 7714	Shen, Zhihua,Wang, Xiao,Wu, Shengli,et al. Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters[J]. JOURNAL OF MICROMECHANICS AND MICROENGINEERING,2016,26([db:dc_citation_issue]).
APA	Shen, Zhihua,Wang, Xiao,Wu, Shengli,&Tian, JinShou.(2016).Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters.JOURNAL OF MICROMECHANICS AND MICROENGINEERING,26([db:dc_citation_issue]).
MLA	Shen, Zhihua,et al."Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters".JOURNAL OF MICROMECHANICS AND MICROENGINEERING 26.[db:dc_citation_issue](2016).

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