Role of Shallow Surface Traps and Polarization Charges in Nitride-based Passivation for AlGaN/GaN Heterojunction FET | |
Yang, Song; Tang, Zhikai; Lu, Yunyou; Jiang, Qimeng; Zhang, Anping; Chen, Kevin J. | |
2016 | |
期号 | [db:dc_citation_issue] |
DOI | [db:dc_identifier_doi] |
页码 | 85-88 |
会议录 | 2016 13TH CHINA INTERNATIONAL FORUM ON SOLID STATE LIGHTING: INTERNATIONAL FORUM ON WIDE BANDGAP SEMICONDUCTORS CHINA (SSLCHINA: IFWS)
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URL标识 | 查看原文 |
ISSN号 | 9781509046133 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/3220632 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Yang, Song,Tang, Zhikai,Lu, Yunyou,et al. Role of Shallow Surface Traps and Polarization Charges in Nitride-based Passivation for AlGaN/GaN Heterojunction FET[C]. 见:. |
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