Detection Dependencies of Statistical Properties for Semiconductor Laser Chaos | |
Li, Xiao-Zhou; Chan, Sze-Chun | |
刊名 | IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS |
2019 | |
卷号 | 25 |
关键词 | Chaos time-dependent exponent optical injection semiconductor lasers |
ISSN号 | 1077-260X |
URL标识 | 查看原文 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/3216898 |
专题 | 大连理工大学 |
作者单位 | 1.City Univ Hong Kong, Dept Elect Engn, Hong Kong, Peoples R China. 2.Dalian Univ Technol, Sch Optoelect Engn & Instrumentat Sci, Dalian 116024, Peoples R China. 3.City Univ Hong Kong, Dept Elect Engn, Hong Kong, Peoples R China. 4.City Univ Hong Kong, State Key Lab Terahertz & Millimeter Waves, Hong Kong, Peoples R China. |
推荐引用方式 GB/T 7714 | Li, Xiao-Zhou,Chan, Sze-Chun. Detection Dependencies of Statistical Properties for Semiconductor Laser Chaos[J]. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS,2019,25. |
APA | Li, Xiao-Zhou,&Chan, Sze-Chun.(2019).Detection Dependencies of Statistical Properties for Semiconductor Laser Chaos.IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS,25. |
MLA | Li, Xiao-Zhou,et al."Detection Dependencies of Statistical Properties for Semiconductor Laser Chaos".IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS 25(2019). |
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