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Detection Dependencies of Statistical Properties for Semiconductor Laser Chaos
Li, Xiao-Zhou; Chan, Sze-Chun
刊名IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS
2019
卷号25
关键词Chaos time-dependent exponent optical injection semiconductor lasers
ISSN号1077-260X
URL标识查看原文
WOS记录号[DB:DC_IDENTIFIER_WOSID]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/3216898
专题大连理工大学
作者单位1.City Univ Hong Kong, Dept Elect Engn, Hong Kong, Peoples R China.
2.Dalian Univ Technol, Sch Optoelect Engn & Instrumentat Sci, Dalian 116024, Peoples R China.
3.City Univ Hong Kong, Dept Elect Engn, Hong Kong, Peoples R China.
4.City Univ Hong Kong, State Key Lab Terahertz & Millimeter Waves, Hong Kong, Peoples R China.
推荐引用方式
GB/T 7714
Li, Xiao-Zhou,Chan, Sze-Chun. Detection Dependencies of Statistical Properties for Semiconductor Laser Chaos[J]. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS,2019,25.
APA Li, Xiao-Zhou,&Chan, Sze-Chun.(2019).Detection Dependencies of Statistical Properties for Semiconductor Laser Chaos.IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS,25.
MLA Li, Xiao-Zhou,et al."Detection Dependencies of Statistical Properties for Semiconductor Laser Chaos".IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS 25(2019).
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