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High power microwave effect of electrostatic discharge type GGMOS protection device
Huang, Zhijuan; Liu, Meiqin; Gong, Ding; Li, Yong; Yang, Zhiqiang
刊名Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams
2016
卷号28
关键词Electrostatic discharge device High power microwave MOSFET Numerical simulation Semiconductor
ISSN号1001-4322
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2955326
专题西安交通大学
推荐引用方式
GB/T 7714
Huang, Zhijuan,Liu, Meiqin,Gong, Ding,et al. High power microwave effect of electrostatic discharge type GGMOS protection device[J]. Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams,2016,28.
APA Huang, Zhijuan,Liu, Meiqin,Gong, Ding,Li, Yong,&Yang, Zhiqiang.(2016).High power microwave effect of electrostatic discharge type GGMOS protection device.Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams,28.
MLA Huang, Zhijuan,et al."High power microwave effect of electrostatic discharge type GGMOS protection device".Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams 28(2016).
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