| Eliminating Re-Burn-In in Semiconductor Manufacturing through Statistical Analysis of Production Test Data | |
| Pham, Hung V.; Demidenko, Serge N.; Merola, Giovanni M. | |
| 2017 | |
| 关键词 | probability logistic regression model statistical analysis integrated circuit manufacturing burn in test |
| 页码 | 1477-1482 |
| 会议录 | 2017 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
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| URL标识 | 查看原文 |
| ISSN号 | 9781509035960 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2946137 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Pham, Hung V.,Demidenko, Serge N.,Merola, Giovanni M.. Eliminating Re-Burn-In in Semiconductor Manufacturing through Statistical Analysis of Production Test Data[C]. 见:. |
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